SCANNING ELECTRON MICROSCOPY

Scanning electron microscopy (SEM) services are used to study surfaces and particles, targeting failure analysis of components, visualization of texture and morphology, or contamination of materials.

Scanning electron microscopy (SEM) analyses

Scanning electron microscopy (SEM) analyses the surfaces of materials, particles, and fibers to measure and assess fine details via image analysis. SEM provides a means for industry to resolve contamination issues, investigate the component failure, identify unknown particulates or study the interaction between substances and their substrates. It can also provide a wealth of information to support the research of materials, chemicals, or biological samples.

The process of interpreting SEM images is not always clear and direct. In tasks such as the interpretation of surface pitting on metal components, identification of particulates, or the exploration of physical and chemical characteristics of the material, SEM becomes an effective technique if appropriate sample preparation methods are used and experienced microscopists perform the analysis.

AUT’s SEM scientists have amassed in-depth industry knowledge across manufacturing, construction, chemicals, energy, healthcare, electronics, polymers, and consumer products. Their expertise can assist you in resolving issues, perform quality control and dramatically increase understanding of materials.

By applying SEM to study surfaces, materials, films, coatings, minerals, raw materials, metals, plastics, food, dust, catalysts, biological tissues, contaminants, or unknown substances, our experts produce high-resolution images and make pertinent observations and measurements. They are also able to examine the internal structure of samples through a variety of cross-sectioning techniques. By working closely with you, our experts’ years of dedicated industry experience in sample preparation and sample analysis will provide you with valuable insight.